Vigor test methods of sweet corn seed for predicting field emergence under cool condition | เธงเธดเธเธตเธงเธฑเธเธเธงเธฒเธกเนเธเนเธเนเธฃเธเธเธญเธเนเธกเธฅเนเธเธเธฑเธเธเธธเนเธเนเธฒเธงเนเธเธเธซเธงเธฒเธเนเธเธทเนเธญเธเธฃเธฐเนเธกเธดเธเธเธงเธฒเธกเธเธญเธเนเธเนเธฃเนเธ เธฒเธขเนเธเนเธชเธ เธฒเธเธญเธฒเธเธฒเธจเนเธขเนเธ
2008
Weeraphan Duanjunchot(Kasetsart University. Kamphaeng Saen Campus, Nakhon Pathom (Thailand). Faculty of Agriculture. Department of Agronomy) | Wanchai Chanprasert(Kasetsart University. Bangkhen Campus, Bangkok (Thailand). Faculty of Agriculture. Department of Agronomy)
Seed vigor test methods by cool germination tests at the temperature of 18 deg C, 16 deg C and 12 deg C were studied in 6 lines/varieties of sweet corn hybrids, i.e. hB9077, hA9035, SK0001, bF0266, bA8105 and SS1266. The cool germination tests were compared with accelerated aging test (41 deg C, 72 hours) and electrical conductivity test in order to predict field emergence percentage of sweet corn planted during low temperature period in January (dry season, day/night temperature of about 20/15 deg C). The results revealed that high correlation coefficient was found between field emergence test under cool condition versus accelerated aging test (41 deg C, 72 hours), cool germination test at 18 deg C and electrical conductivity test (r = 0.988**, 0.992** and 0.971**, respectively). Linear regression was employed to explain these relationships of sweet corn seed with the equation of y = 1.7168 x - 72.174, y = 0.9342 x + 5.162 and -0.5771 x + 104.18, respectively. These 3 vigor tests can be used as screening methods of hybrid sweet corn for high seed vigor and tolerance to low temperature during field emergence.
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