Interpreting Yield Variability with Electrical Conductivity and Terrain Attributes across a Central Kentucky Landscape
2005
Sears, B. G. | Mijatovic, B. | Mueller, T. G. | Barnhisel, R. I.
Interpretation of yield maps for management requires an adequate understanding of the factors that influence the variability of crop productivity. The objective of this study was to investigate the use of precision agriculture technologies for interpreting corn grain yield variability across a Central Kentucky landscape. Yields were measured in 2003 and 2004 on 75 plots distributed along four transects. Bulk soil electrical conductivity (EC), depth to bedrock, and topsoil clay content were also measured at each site. Digital elevation models (DEMs) were used to calculate terrain attributes. Slope, aspect, and curvature did not relate well with yield in either year. The specific catchment area and bulk soil EC were useful for explaining yield variability in 2004, when 8.6 inches of rain over eight-days resulted in the flooding of lowland areas early in the growing season. Multiple regression models accounted for 65% of the variability in 2004 but only 20% in 2003. Our findings suggest that specific catchment area and EC can be useful for understanding yield variability in years rain events cause flooding. Potentially, these tools could also be used to aid in artificial drainage and land-use decisions.
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