Compact Design and Impact Ionization: Utilizing Small-Sized Thyristors in a 4-Stage Marx Generator
2025
Alicia del Barrio Montañés | Viliam Senaj | Thomas Kramer | Georg Müller | Martin Sack
In CERN’s beam transfer lines, high-voltage generators have traditionally relied on thyratron switches; however, thyratrons present operational challenges and are also becoming increasingly hard to source. To address this issue, there is a growing interest in adopting compact pulse generators made from commercially available off-the-shelf (COTS) components. Recent research has demonstrated that thyristors designed for rectifier applications, which are not specifically designed for fast rise times, can be activated in overvoltage mode—also referred to as impact-ionization mode. These devices achieve substantial improvements in their dU/dt and dI/dt characteristics. This activation method involves applying a substantial overvoltage between the thyristor’s anode and cathode, along with a fast slew rate exceeding 1 kV/ns. The adoption of compact pulse generators built from COTS components opens up new opportunities for deploying this technology across multiple domains, including high-speed kicker generators in particle accelerators. In our methodology, we incorporated commercially available high-voltage components—SiC MOSFETs—that were triggered using a fast gate driver, which was custom-designed. The generated output pulse was then amplified and sharpened in a four-stage Marx generator composed of small, <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>1.2</mn></mrow></semantics></math></inline-formula> kV rated D2PAK thyristors. This configuration yielded an output pulse with an amplitude of 11 kV and a 10–90% dU/dt of <inline-formula><math xmlns="http://www.w3.org/1998/Math/MathML" display="inline"><semantics><mrow><mn>13.3</mn></mrow></semantics></math></inline-formula> kV/ns. The present study details the design of the Marx generator and the resulting pulses, along with the challenges faced in high-voltage measurements.
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