All polarization properties of PLZT ferroelectric ceramics observed in two dimensional distributions under applied voltage by the Mueller matrix

This paper describes spatial distributions of all polarization properties of anti-ferroelectric PLZT-8.9/65/35 (lead lanthanum zirconate titanate) ceramics as a function of the applied voltage. The application of PLZT in optical devices requires an understanding of the distributions of its optical characteristics. However, birefringence measurement, which is a general method for observing the distribution of optical characteristics, is not useful for the evaluation of other polarization properties. For the quantitative measurement of all of the polarization properties, therefore, we focused on the Mueller matrix, which describes all of the polarization properties. Initially, in order to evaluate the optical characteristics of PLZT for optical devices that are not based on the spatial distributions of the polarization properties, all of the integral polarization properties, which are the averages of each polarization property, were measured using a dual-rotating retarder polarimeter. These results were then used to valuate the significance of the polarization property distributions measured using the polarimeter combined with a microscope, which enabled detection of the spatial distributions of the Mueller matrix. We have observed that birefringence indicates the distributions that depend on the grain structure. With increasing voltage, the birefringence is oriented by the external electric field. Thus, a reduction of the variation in the birefringence can be achieved by maintaining direction of the electrical polarization, and this reduction causes a decrease in the depolarization. These measurements are useful for revealing the optical behavior of ferroelectric ceramics, and provide helpful information for the development of optical devices.