AGRIS - International System for Agricultural Science and Technology

Electron beam damage of epoxy resin films studied by scanning transmission X-ray spectromicroscopy

2019

Zhang, Weiwei | Melo, Lis G. de A. | Hitchcock, Adam P. | Bassim, Nabil


Bibliographic information
Micron
Volume 120 Pagination 74 - 79 ISSN 0968-4328
Publisher
Elsevier Ltd
Other Subjects
Electron beam damage; Transmission electron microscopy; X-radiation; Epoxy resin film; X-ray absorption spectroscopy; Carbon deposition; Electrons; Films (materials); Chemical bonding; Cryo-electron microscopy; Scanning transmission x-ray microscopy; Scanning electron microscopy; Electric potential difference
Language
English
Type
Journal Article; Text

2024-02-28
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