Diallel analysis of bean crosses for resistance to bean stem maggot (Ophiomyia spp)
1995
Mushi, Clemence S. | Slumpa, Simon
Nine bean lines/cultivars that reconfirmed to have high levels of resistance to bean stem maggot (BSM) were crossed to form a 9 x 9 diallel. The crosses were advanced to F2 and then evaluated at Selian Agric. Research Institute under high BSM population. Trial design used was RCB with three replications. Numbers of black/brown pupae per plant, dead plants due to BSM and plants survival at physiological maturity were recorded. Diallel analysis performed on the number of plants that survived indicated that additive gene effects were more important than non-additive gene effects in determining the expression of resistance to BSM. However, the study revealed that non-additive gene effects were important in some parental combinations.
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