Examination of the Leeper Corn Yield Model, a weather based - phenologically timed yield forecasting model [USA; Illinois; Indiana; Iowa; Missouri].
1979
Klugh B.F. Jr.
Bibliographic information
[Unnumbered report] - U.S. Dept. of Agriculture
Language
English
Note
9 ref. AVAILABILITY: NAL, USDA, Beltsville, Md. 20705 - USA
Type
Journal Article; Non Conventional
Corporate Author
Institut National Agronomique, El harrach (Algeria).
2012-11-15
AGRIS AP
Data Provider
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