Mode of Response of Weed-Free Corn to Post-Planting Cultivation
1967
Prihar, Sohan S. | Van Doren, D. M.
Maximum corn grain yield increase associated with post-planting cultivation of weed-free corn on a soil susceptible to crusting was 1,790 kg/ha or 25% of mean yield. The maximum contribution of increased water infiltration was 770 kg/ha. The remaining causes of yield increase associated with stirring the soil surface were not unequivocably established. Oxygen diffusion rates at 10-cm depth were essentially unaffected by cultivation. Cultivation reduced short term evaporation from the soil surface 30 to 45% and resulted in a twofold to sixfold increase in root weights between corn rows to a depth of 23 cm.
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