AGRIS - International System for Agricultural Science and Technology

Post-processing methods to eliminate erroneous grain yield measurements: review and directions for future development

2014

Lyle, G. | Bryan, B. | Ostendorf, B.

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Bibliographic information
Publisher
Springer Verlag
Other Subjects
Yield mapping; Post-processing methods
Language
English
License
© Springer Science+Business Media New York 2013
ISSN
1573-1618, 0000-0002, 5868-3567
Type
Journal Article
Source
https://doi.org/10.1007/s11119-013-9336-3

2024-10-18
2025-04-17
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