Regression analysis for yield components and quality traits in wheat
2016
Kumar, Dinesh Kumar | Kerkhi, Sayed Ahmad | Singh, Yash Pal | Bind, Harinarayan
The objective of the experiment was to evaluate the genetic parametersof ten genotypes using half diallel analysis. The experiment wasconducted at Crop Research Centre, Sardar Vallabhbhai Patel University of Agriculture and Technology, Meerut in randomized complete block design (RCBD) using three replications as blocks. The regression analysis using Haymans’ approach for days to 50% flowering, days to maturity, number of productive tillers/plant and spikelets per spike revealed that positive intercepts of Wr-Vr regression line supported an additive gene action with partial dominance and the selection could be fruitful for these traits in early  egregating generations. While, the regression analysis for traits viz., plant  eight, flag leaf area, spike length, grains per spike, 1000-grain weight,biological yield per plant, grain yield per plant, harvest index, ash content and gluten content revealed that negative intercepts of Wr-Vr regression line supported an over-dominance gene action and selection should be delayed to later generations.
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Este registro bibliográfico ha sido proporcionado por Indian Council of Agricultural Research