Quantitative X-ray fluorescence analysis of an Egyptian faience pendant and comparison with PIXE
2009
de Viguerie, L | Durán, Alfredo (Durán Nuñez del Prado) | Bouquillon, A | Solé, V. A | Castaing, J | Walter, P
The X-ray fluorescence (XRF) technique is a common choice in the archaeometric field for in situ investigations with portable instruments. This work shows that XRF portable systems can be used for quantitative analyses using appropriate software, obtaining a similar accuracy to that provided with other techniques such as particle-induced X-ray emission (PIXE), as shown for an Egyptian faience pendant and for two glass standards.
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