Relationship between Asperity-Mediated Surface Forces and Topography Alteration of Silica Microspheres Sliding on Mica, Sapphire, and Glass Substrates under Ambient Conditions: Atomic Force Microscopy and Theoretical Studies
2014
Zhang, Dan | Chen, Xin-qiang | Wang, You | Zhang, Fei-hu | Gan, Yang
Contact geometry significantly influences adhesive force measurements and modeling for adhesion/friction studies where an AFM colloidal probe technique has been extensively employed. Here we present a systematic study on the topography alteration of silica microspheres sliding on mica, sapphire, and glass substrates under ambient conditions at a relative humidity of 30–55% and the consequential adhesion behaviors of worn microspheres through AFM direct force measurements and theoretical modeling. The wearing of microspheres creates a truncated platform, which is largest for sliding on glass substrates. On the platform are nanoasperities consisting of wear debris and airborne particulate contaminants. Variations in adhesive forces with sliding time and testing modes as well as the effect of surface roughness of substrates are explained within the theoretical framework of nanoasperity-mediated capillary and van der Waals forces. The drawbacks of the present reverse-imaging method for microsphere topography examination, and numerous sources of errors associated with the extraction of key parameters for force modeling, are discussed in detail. The results will also have important implications for more reliable AFM colloidal probe technique and its application in adhesion and tribological studies.
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