Genetic variability of resistance and yield losses due to Asian corn borer (Ostrinia furnacalis, Guenee) in a corn population
1986
Barlaan, E.A. | Lantin, M.M. (Philippines Univ., Los Banos, College, Laguna (Philippines))
Sixty unselected S1 lines of Antigua Gpo 1, a corn borer resistant population were evaluated under protected and artificially infested conditions to determine the genetic variability of resistance to corn borer, yield and agronomic characters; and estimate the yield loss due to corn borer infestation. Significant variations among lines were obtained for leaf feeding damage, plant height, days to silking and grain yield but not in overall plant damage, tunnel length and yield loss which had high coefficients of variability. Genetic variability of resistance to leaf feeding existed in this population. Additive genetic variance was predominant in this trait. Further improvement in the level of resistance is attainable in this population. A considerable genetic gain could be expected using S1 family selection. Percent yield loss due to corn borer damage ranged from 2.71 to 44.9% with a mean yield loss of 20.6%.
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