Determination of yeast cell wall thickness and cell diameter using new methods
1998
Srinorakutara, T. (Thailand Inst. of Scientific and Technological Research, Bangkok)
Yeast cell bursting strengths in spent medium and cell diameters have been measured across batch fermentations using micromanipulation. The cell diameters could be measured using a Coulter counter and an image analyzer. The relative cell wall thicknesses have been determined from TEM micrographs using an image analyzer. Cacodylate fixative solution could be used to fix yeast cells effectively, for later TEM microscopy analysis. The TEM micrographs were sufficiently clear to allow useful studies of yeast cell morphology, especially of the cell wall. The relative cell diameters from TEM micrographs could also be obtained using the image analyzer. A model used to determine actual cell wall thicknesses and cell diameters is proposed here. Agreement of cell diameter determined using four different methods is found in this study
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