Economic Injury Levels for the Common Cutworm, Spodoptera litura (Fabricius) (Lepidoptera: Noctuidae) on Soybean
2006
Lee, G.H. (Yeongnam Agricultural Research Institute, NICS, RDA, Milyang, Republic of Korea), E-mail: [email protected] | Bae, S.D. (Yeongnam Agricultural Research Institute, NICS, RDA, Milyang, Republic of Korea) | Kim, H.J. (Yeongnam Agricultural Research Institute, NICS, RDA, Milyang, Republic of Korea) | Park, S.T. (Yeongnam Agricultural Research Institute, NICS, RDA, Milyang, Republic of Korea) | Choi, M.Y. (Honam Agricultural Research Institute, NICS, RDA, Iksan, Republic of Korea)
The damage aspects of soybean by common cutworm, Spodoptera litura (Fabricius) (Lepidoptera: Noctuidae) at different larval density and different growth stage of soybean were studied in soybean field. The percent yield reduction(Y) of soybean infested by different densities of S. litura (X, no. of larvae/plant) under outdoor conditions for a three week period were estimated by the following equations: (1) Y = 1.655X - 6.025 (R²=0.952) for the R1 (flowering stage); (2) Y = 0.725X - 0.475 (R²=0.986) for the R3 (beginning pod stage); and (3) Y = 0.635X - 1.325 (R²=0.986) for the R5 (beginning seed stage).
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