Path analysis of some leaf and panicle traits affecting grain yield in doubled haploid lines of rice (Oryza sativa L.)
2007
Babar, M. (Bahauddin Zakarya Univ., Multan (Pakistan). Inst. of Bio-technology) | Khan, A.A. (University of Agriculture, Faisalabad (Pakistan). Dept. of Plant Breeding and Genetics) | Arif, A. (National Inst. for Biotechnology and Genetic Engineering, Faisalabad (Pakistan). Plant Biotechnology Div.) | Zafar, Y. (National Inst. for Biotechnology and Genetic Engineering, Faisalabad (Pakistan). Plant Biotechnology Div.) | Arif, M.
Path coefficient analysis for some leaf and panicle traits affecting grain yield was accomplished in 93 doubled haploid lines of rice (Oryza sativa L.) at National Institute for Biotechnology and Genetic Engineering, Faisalabad, Pakistan during 2004. The measures of variability revealed substantial variation among doubled haploid lines for the traits studied. Broad sense heritability estimates for grain yield per plant, flag leaf width, plant height and panicle length ranged from 0.74 to 0.80. Genotypic and phenotypic correlation coefficients were positive for all the character combinations. A strong genotypic association of plant height was observed for panicle length and flag leaf length. Genotypic and phenotypic correlation between days to heading and flag leaf length was positive and high. Path coefficient analysis indicated that plant height followed by number of panicles, flag leaf width, days to heading and flag leaf rolling had higher direct effect on grain yield.
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