Detection of Silicon in Wheat (Triticum aestivum) Using Laser Induced Breakdown Spectroscopy and Phytolith Analysis
2011
Chauhan, D. K. | Tripathi, D. K. | Agrawal, Rahul | Rai, A. K.
In the present study the point detection capability has been used especially for Silicon analysis. Output of Nd:YAG laser is focused in different parts of the wheat leaf to produce the laser induced plasma on the leaf surface. Light emitted from the plasma is collected and analyzed by LIBS 2000 + spectrometer. LIBS Spectra of wheat was recorded under optimized experimental conditions and analyzed. LIBS spectra of target material show the presence of atomic lines of numerous elements such as Si, Ca, Mg, Fe, C, Ti. These elements play an important role in the physiological activities of wheat plants. Silicon detection from LIBS is compared with the phytolith analysis of wheat leaves.
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