Molecular Characterization of Slow Leaf-Rusting Resistance in Wheat
2005
Xu, Xiangyang | Bai, Guihua | Carver, Brett F. | Shaner, Gregory E. | Hunger, Robert M.
Slow leaf-rusting resistance in wheat (Triticum aestivum L) is gaining acceptance as a breeding objective because of its durability in comparison with race-specific resistance. CI 13227 was previously reported to provide the highest level of slow leaf-rusting resistance. The objective of this study was to characterize the slow leaf-rusting resistance conferred by CI 13227 using molecular markers. A population of recombinant inbred lines (RILs) derived from CI 13227/Suwon 92 was evaluated for final severity (FS), area under disease progress curve (AUDPC), infection rate (IR), and infection duration (ID) of leaf rust. Four hundred fifty-nine amplified fragment length polymorphism (AFLP) markers and 28 simple sequence repeat (SSR) markers were analyzed in the population. Two quantitative trait loci (QTL), designated as QLr.osu-2B and QLr.osu-7BL, were consistently associated with AUDPC, FS, and IR of leaf rust, caused by Puccinia triticina (previously P recondita Rob. Ex Desm. f. sp. tritici). The percentages of phenotypic variance explained by each QTL varied with experiments and traits, ranging from 13.4 to 18.8% for AUDPC, 12.5 to 20.8% for FS, and 12.9 to 16.1% for IR. The third QTL for leaf rust ID, designated as QLrid.osu-2DS, was located on chromosome 2DS and explained 26.4 and 21.47% of the phenotypic variance in 1994 and 1995, respectively. Both the QTL and correlation analysis indicate reasonable progress in leaf-rusting resistance by selecting for final severity. SSR markers closely associated with QLr.osu-2B or QLr.osu-7BL have potential to be used in marker-assisted selection (MAS) for durable leaf rust resistant cultivars.
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