Rheological properties and lipid oxidation of rice decontaminated with low-energy electrons
1998
Hayashi, T. | Okadome, H. | Toyoshima, H. | Todoriki, S. | Ohtsubo, K.
Microbial load and quality of rice grains which were exposed to electrons at different acceleration voltages of 170 to 200 kV were examined to evaluate the efficacy of decontaminating rice with low-energy electrons. Electrons at any acceleration voltage between 170 and 200 kV reduced microbial loads of brown rice grains to levels lower than 10 colony-forming units (CFU)/g. Higher acceleration voltages resulted in a lower viscosity and a higher thiobarbituric acid value (TBA). Milling at a yield of 90 or 88% after electron treatment made the viscosity and TBA of rice treated with electrons at 170 kV almost the same as untreated rice. Low and high compression analyses of rice grains which were exposed to electrons at 170 to 180 kV and milled at a yield of 90% followed by cooking showed almost the same hardness and stickiness as untreated grains which were milled at 90%. The results indicate that milling at a yield of 90% or lower removes the portion of rice exposed to electrons at 170 kV and that treatment of brown rice with low-energy electrons enables the preparation of milled rice with extremely low levels of microbial load and little quality deterioration.
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