Assessing leaf nitrogen content and leaf mass per unit area of wheat in the field throughout plant cycle with a portable spectrometer
2013
Ecarnot, Martin, M. | Compan, Frederic, F. | Roumet, Pierre, P. | Amélioration génétique et adaptation des plantes méditerranéennes et tropicales (UMR AGAP) ; Centre de Coopération Internationale en Recherche Agronomique pour le Développement (Cirad)-Institut National de la Recherche Agronomique (INRA)-Centre international d'études supérieures en sciences agronomiques (Montpellier SupAgro)-Institut national d’études supérieures agronomiques de Montpellier (Montpellier SupAgro)
Leaf nitrogen content (LNC) and leaf mass per unit area (LMA) were assessed by near-infrared spectroscopy (NIRS) on fresh and dried plants of durum wheat (Triticum turgidum ssp). Individual leaves were scanned with a portable spectrometer and reference analyses of LNC and LMA were then carried out. Partial least squares (PLS) regression was used for calibration and cross-validation. INC was accurately predicted for both fresh and dry leaves whatever the phenologic stage (correlation coefficient of calibration R(2)cal ranging from 0.932 to 0.958, standard error of cross-validation SECV ranging from 0.215 to 0.320% (dry matter)). LMA was predicted with R(2)cal = 0.942 and SECV = 4.84g m(-2). The combination of these two calibrations made it possible to predict leaf nitrogen per unit area (R(2)cross-validation = 0.94, SECV = 0.248 gN m(-2)) and provides a relevant and non-destructive tool for following the dynamics of three major leaf parameters.
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