Yield variability within the field of winter wheat [precision agriculture]
2001
Faber, A. | Jadczyszyn, T. (Institute of Soil Science and Plant Cultivation, Pulawy (Poland). Dep. of Agrometeorology and Applied Informatics)
The objective of studies and statistical analysis conducted was to compare grain yield variability in raw data and yield maps obtained for both data files and to explain this variability with data from growth monitoring. The studies and analysis conducted point out that the accurate yield monitor calibration is essentail for generation of good quality yield maps, and postprocessing manipulation of data can reduce only partly influence of calibration and operator related effects in map construction
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