Wheat growth profile: satellite monitoring and crop yield modelling
2004
Manjunath, K. R. | Potdar, M. B.
The most important advantage of the low resolution National Oceanic and Atmospheric Administration’s Advanced Very High Resolution Radiometer (NOAA AVHRR) data is its high temporal frequency and high radiometric sensitivity which helps in vegetation detection in the visible and near-infrared spectral regions. In areas where most of the crop cultivation is in large contiguous areas, and if the AVHRR data are selected for time period such that the crop of interest is well discriminated from other crops, these data can be used for monitoring vegetative growth and condition very effectively. The present study deals with the application of AVHRR data for the monitoring of the wheat crop in its seventeen main growing districts of the Rajasthan state. The fourteen date AVHRR data covering the entire growth period have been used to generate the normalized difference vegetation index (NDV1) growth profile for the crop by masking the non-crop pixels following the two-date NDVI change method. The growth profile parameters and other derived parameters, such as post-anthesis senescence rate and areas under the entire growth profile or under selected growth periods have been related to the district average wheat yield through statistical regression models. Various methods adopted for wheat pixels masking have been critically evaluated. It is found that the wheat yield can be predicted well by the area under the profile in different growth periods.
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