A Test Data Compression Scheme Based on Irrational Numbers Stored Coding
2014
Hai-feng Wu | Yu-sheng Cheng | Wen-fa Zhan | Yi-fei Cheng | Qiong Wu | Shi-juan Zhu
Test question has already become an important factor to restrict the development of integrated circuit industry. A new test data compression scheme, namely irrational numbers stored (INS), is presented. To achieve the goal of compress test data efficiently, test data is converted into floating-point numbers, stored in the form of irrational numbers. The algorithm of converting floating-point number to irrational number precisely is given. Experimental results for some ISCAS 89 benchmarks show that the compression effect of proposed scheme is better than the coding methods such as FDR, AARLC, INDC, FAVLC, and VRL.
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