Effects of Silicon Application on Yield, Spectral Index, and Fall Armyworm (<i>Spodoptera frugiperda</i>) Infestation on Maize (<i>Zea mays</i>) Crop
Nelson Fernando Galindo-Gutiérrez | Yeison Alberto Garcés-Gómez
This paper presents the implementation of statistical and remote sensing techniques to analyze the spectral response, grain yield, and infestation of fall armyworm (<i>Spodoptera frugiperda</i>) in corn (<i>Zea mays</i>) based on the application of edaphic and foliar treatments with silicon, comparing the results with those reported in the literature where it has been demonstrated that the incorporation of this nutrient in different crops improves the activity of the enzyme nitrate reductase and dry matter weight gain. The results show that the foliar application of silicon tends to increase grain production in the crop, while the soil treatment does not improve yield. Similarly, foliar silicon application improves the Normalized Difference Vegetation Index, which improves plant health and could be correlated with higher grain yield of the crop. An inverse correlation was detected between the use of foliar silicon and the Normalized Difference Water Index and a direct relationship in the case of direct field application. As for the analysis of the data to verify the influence of the use of silicon on fall armyworm infestation, no statistically significant evidence was found that would lead to the conclusion that the application of this element, whether in soil or foliar form, could lead to a decrease in crop infestation.
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