Development of AFLP Derived SCAR Marker Linked to Disease Resistance to Late Blight (Phytophthora infestans) in Potato
2005
Lee, S.P. (Kangwon National University, Chuncheon, Republic of Korea) | Kim, H.Y. (Dongguk University, Seoul, Republic of Korea) | Cho, H.M. (National Institute of Highland Agriculture, RDA, Pyeongchang, Republic of Korea) | Kim, K.J. (Kangwon National University, Chuncheon, Republic of Korea) | Jung, H.S. (Kangwon National University, Chuncheon, Republic of Korea) | Lee, Y.S. (Kangwon National University, Chuncheon, Republic of Korea), E-mail: [email protected] | Park, Y.E. (National Institute of Highland Agriculture, RDA, Pyeongchang, Republic of Korea)
Late blight caused by the oomycete Phytophthora infestans is the most serious fungal disease in potato cultivation worldwide. Late blight resistance is demanding the attention of potato breeders worldwide following recent migrations of aggressive metalaxyl-resistant isolates of Phytophthora infestans in potato production areas. Resistance to late blight was controlled by a few major genes (R gene) which can be easily overcame by new races of Phytophthora infestans and an unknown number of genes expressing a quantitative type of resistance which may be more durable. In this study, we used AFLP method to identify markers linked to resistance trait.
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