An effective method for detection and analysis of DNA damage induced by heavy-ion beams
2007
Kazama, Y.(Institute of Physical and Chemical Research, Wako, Saitama (Japan)) | Saito, H. | Fujiwara, M. | Matsuyama, T. | Hayashi, Y. | Ryuto, H. | Fukunishi, N. | Abe, T.
We have developed an efficient system to detect and analyze DNA mutations induced by heavy-ion beams in Arabidopsis thaliana. In this system, a stable transgenic Arabidopsis line that constitutively expresses a yellow fluorescent protein (YFP) by a single-copy gene at a genomic locus was constructed and irradiated with heavy-ion beams. The YFP gene is a target of mutagenesis, and its loss of function or expression can easily be detected by the disappearance of YFP signals in planta under microscopy. With this system, a sup(12)Csup(6+)- induced mutant with single deletion and multiple base changes was isolated.
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