Developmental growth patterns of some cotton plant parameters.
1996
Tallon R.B. | Barroga M.E. | Abrina Y.L. | Cosico V.B.
Plant height, total dry matter yield, dry matter yield of the vegetative parts and leaf area index had growth patterns that best fitted to the logistic growth regression or the sigmoid curve model. A logarithmic model: Y = a + b In X, described the pattern of growth increments on the number of mainstem nodes, sympodial branches, number of fruiting points, and bolls per plant, and the net assimilation rate. On the other hand, a quadratic regression model, Y = a + b1X + b2X square, described the growth patterns of the total leaf area, number of main stem leaves and squares per plant, and the crop growth rate. Meanwhile, the dry matter accumulation of the reproductive parts followed the power regression model, Y = (a x raised to power b), while the R:V ratio fitted to an exponential regression model, Y = (a) (e raised to power bx). The identified regression and correlation models can be applied to analyze and established field crop monitoring growth models in the 14 cotton Development Enhancement Program areas in the country.
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