Winter wheat leaf diseases and several steps included in their integrated control: a review
2019
Svarta, A., Latvia Univ. of Life Sciences and Technologies, Jelgava (Latvia) | Bimsteine, G., Latvia Univ. of Life Sciences and Technologies, Jelgava (Latvia)
Winter wheat (Triticum aestivum L.) leaf diseases are an important risk factor that influences the productivity and quality of wheat production. The aim of the present study was to review published scientific literature about the possibilities for integrated control of winter wheat leaf diseases. The most common and economically important wheat leaf diseases are Septoria leaf blotch (caused by Zymoseptoria tritici), tan spot (caused by Pyrenophora triticirepentis), yellow rust (caused by Puccinia striiformis), and powdery mildew (caused by Blumeria graminis). The severity of winter wheat diseases has varied significantly over the years and depended on meteorological conditions, variety resistance to pathogen, and tillage system. The crop rotation and an efficient residue management significantly decrease the development of tan spot. The development of Septoria leaf blotch mainly depends on meteorological conditions, but agronomic practice is less important. The use of disease-resistant varieties is the most economical, safe, and effective way to prevent and control wheat leaf diseases. Many European countries have a number of decision support systems for optimizing and minimizing the use of fungicides. Decision support systems are based on control thresholds and meteorological observations. Most used parameters are: air temperature, relative air humidity, and precipitation. These systems have been developed in the countries with a milder climate and a longer vegetation period than Latvia, and systems need to be adapted to Latvian conditions. The main groups of fungicides for disease control in winter wheat are azoles, strobilurin, and carboxamides. The results of many studies about the effectiveness of fungicide groups show that the obtained results differ and further research is needed.
显示更多 [+] 显示较少 [-]