AGRIS - 国际农业科技情报系统

A zoom into the nanoscale texture of secondary cell walls

2014

Keplinger, Tobias | Konnerth, Johannes | Aguié-Beghin, Véronique | Rueggeberg, Markus | Gierlinger, Notburga | Burgert, Ingo


书目信息
其它主题
Atomic force microscopy; Scanning near field optical microscopy; Diffraction limit; Secondary cell walls
语言
英语
类型
Journal Article

2016-10-15
2025-12-04
AGRIS AP