X-ray photoelectron spectroscopy for wheat powders: measurement of surface chemical composition
2011
Saad, Moustafa | Gaiani, Claire | Mullet, Martine | Scher, Joël | Cuq, Bernard | Ingénierie des Agro-polymères et Technologies Émergentes (UMR IATE) ; Centre de Coopération Internationale en Recherche Agronomique pour le Développement (Cirad)-Institut National de la Recherche Agronomique (INRA)-Université Montpellier 2 - Sciences et Techniques (UM2)-Centre international d'études supérieures en sciences agronomiques (Montpellier SupAgro)-Université de Montpellier (UM)-Institut national d’études supérieures agronomiques de Montpellier (Montpellier SupAgro) | Laboratoire d'Ingénierie des Biomolécules (LIBio) ; Université de Lorraine (UL) | Laboratoire de Chimie Physique et Microbiologie pour l'Environnement (LCPME) ; Institut de Chimie du CNRS (INC)-Université de Lorraine (UL)-Centre National de la Recherche Scientifique (CNRS) | Ministry of Higher Education and Scientific Research in Syria; Agence National de la Recherche (ANR) in France | ANR-08-ALIA-0015,Réactive-Powder,Contribution des facteurs "procédés" et des "propriétés de surface" des particules dans les mécanismes impliqués dans la granulation de poudres alimentaires(2008)
IATE Axe 2 : Structuration sous contraintes des agropolymères et réactivité des poudres Contact: [email protected]
显示更多 [+] 显示较少 [-]英语. The functional properties of wheat powders depend largely on the surface characteristics of their particles. X-ray photoelectron spectroscopy (XPS) has been considered to investigate the surface composition of wheat powders. The objective of the present study is to evaluate the ability of XPS to discriminate wheat components and to calculate the surface composition of wheat powders. First, XPS surveys for the main wheat isolated components (starch, proteins, arabinoxylans, and lipids) were determined. XPS results demonstrate that it is able to distinguish wheat proteins, polysaccharides, and lipids, but it is not able to distinguish starch and arabinoxylan because of their similarity in chemical structure. The XPS analyses of simple reconstituted wheat flours based on two components (starch and protein) or three components (by adding arabinoxylan) demonstrated the ability of XIS to measure the surface composition of the wheat flours. The surface composition of native wheat flour demonstrated an overrepresentation of protein (54%) and lipids (44%) and an underrepresentation of starch (2%) compared to the bulk composition. Results are discussed with regard to difficulties in discriminating arabinoxylans components.
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