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Characterisation of the structural heterogeneity of the soil tilled layer by using in situ 2D and 3D electrical resistivity measurements

Séger, M. | Cousin, I. | Frison, A. | Boizard, H. | Richard, G.


书目信息
103 2 页码 387 - 398 ISSN 0167-1987
出版者
Springer-Verlag
其它主题
Three dimensional; Soil cultivation and cropping systems; Two dimensional; Soil chemistry and physics; Nondestructive methods; Computed tomography
语言
英语
注释
Includes references
类型
Journal Article; Text

2024-02-28
2026-02-03
MODS