Cell wall investigations utilizing tip-enhanced Raman scattering

2008

BUDICH, C. | NEUGEBAUER, U. | POPP, J. | DECKERT, V.


书目信息
Journal of microscopy
229 3 页码 533 - 539 ISSN 0022-2720
出版者
Blackwell Publishing Ltd
其它主题
Near field; Atomic force; Cell wall; Ters; Cell wall; Raman; Spectrum analysis; Raman; Instrumentation
语言
英语
类型
Journal Article; Text

2024-02-28
MODS