QTL mapping identifies a major locus for resistance in wheat to Sunn pest (Eurygaster integriceps) feeding at the vegetative growth stage

2017

Emebiri, L. C. | Tan, M.-K. | El-Bouhssini, M. | Wildman, O. | Jighly, A. | Tadesse, W. | Ogbonnaya, F. C.


书目信息
Theoretical and applied genetics
130 2 页码 309 - 318 ISSN 0040-5752
出版者
Springer Berlin Heidelberg
其它主题
Vegetative growth; Durum wheat; Grain quality
语言
英语
类型
Journal Article; Text

2024-02-28
MODS