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Fourier Features and Machine Learning for Contour Profile Inspection in CNC Milling Parts: A Novel Intelligent Inspection Method (NIIM)

2024

Manuel Meraz Méndez | Juan A. Ramírez Quintana | Elva Lilia Reynoso Jardón | Manuel Nandayapa | Osslan Osiris Vergara Villegas


书目信息
14 18 页码 8144 ISSN 2076-3417
出版者
MDPI AG
其它主题
Machine vision; Fourier descriptors; Contour profile
语言
英语

2024-12-11
2025-10-24
DOAJ