Fourier Features and Machine Learning for Contour Profile Inspection in CNC Milling Parts: A Novel Intelligent Inspection Method (NIIM)

2024

Manuel Meraz Méndez | Juan A. Ramírez Quintana | Elva Lilia Reynoso Jardón | Manuel Nandayapa | Osslan Osiris Vergara Villegas


书目信息
Applied Sciences
14 18 页码 8144 ISSN 2076-3417
出版者
MDPI AG
其它主题
Machine vision; Contour profile; Fourier descriptors
语言
英语

2024-12-11
DOAJ