Yolo Based Defects Detection Algorithm for EL in PV Modules with Focal and Efficient IoU Loss

2024

Shen Ding | Wanting Jing | Hao Chen | Congyan Chen


书目信息
Applied Sciences
14 17 页码 7493 ISSN 2076-3417
出版者
MDPI AG
其它主题
El defects in photovoltaic components; Focal-eiou loss; Eiou; Serial network; Yolov5
语言
英语

2024-12-11
DOAJ