In-hive flatbed scanners for non-destructive, long-term monitoring of honey bee brood, pathogens and pests
2024
Borlinghaus, Parzival | Gülzow, Jörg Marvin | Odemer, Richard
Honey bee colonies face significant threats from pathogens and pests, including chalkbrood disease caused by Ascosphaera apis and Varroa destructor mites. Traditional monitoring methods for these issues are often destructive, hindering continuous and detailed observations. This study introduces a novel, non-destructive monitoring technique using a modified flatbed scanner integrated into a honey bee brood frame. The scanner, housed within a Dadant frame and connected to a Raspberry Pi, captures high-resolution images of the brood cells at regular intervals. This method enables continuous observation of the brood life cycle, including egg laying, larval development, and the presence of pathogens and mites. Over a three-month pilot study, the scanner successfully monitored 419 cells, capturing images of each cell and documenting critical events such as Varroa infestations and chalkbrood development. The method demonstrated high-resolution imaging capabilities, enabling detailed analysis of pathogen dynamics and hygienic behaviors like Varroa-sensitive hygiene (VSH) without apparent disturbance of the colony. The results revealed a high frequency of brood removal and pathogen detection, providing insights into the natural behaviors of honey bees and their interactions with pests.
显示更多 [+] 显示较少 [-]AGROVOC关键词
书目信息
出版者 Elsevier B.V.
ISSN 2772-3755