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Study on the Destruction and Removal Efficiency (DRE) of Perfluorinated Compound Gases Used in Semiconductor and Display Processes in Korea: DRE and Uncertainty by Scrubber Type

2024

Seongmin Kang | Jiyun Woo | Goeun Kim | Daekee Min | Joohee Lee | Eui-chan Jeon


书目信息
Processes
12 11 ISSN 2227-9717
出版者
Multidisciplinary Digital Publishing Institute
其它主题
Destruction and removal efficiency; Pfc gases; Semiconductor and display processes
语言
英语
类型
Journal Article

2025-07-18
AGRIS AP