Determining alloy concentration by analyzing dynamic diffraction at strained semiconductor interfaces
2024
Otto Frederik | Niermann Laura | Niermann Tore | Lehmann Michael
Bibliographic information
BIO Web of Conferences
Volume
129
Pagination
07017
ISSN
2117-4458
Publisher
EDP Sciences
Other Subjects
Dynamic-diffraction; 4d-stem; Composition-determination; Relaxation; Strain
Language
English
2024-12-11
2024-12-13
DOAJ
Data Provider
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