AGRIS - International System for Agricultural Science and Technology

Fourier Features and Machine Learning for Contour Profile Inspection in CNC Milling Parts: A Novel Intelligent Inspection Method (NIIM)

2024

Manuel Meraz Méndez | Juan A. Ramírez Quintana | Elva Lilia Reynoso Jardón | Manuel Nandayapa | Osslan Osiris Vergara Villegas


Bibliographic information
Applied Sciences
Volume 14 Issue 18 Pagination 8144 ISSN 2076-3417
Publisher
MDPI AG
Other Subjects
Machine vision; Contour profile; Fourier descriptors
Language
English

2024-12-11
DOAJ
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