Yolo Based Defects Detection Algorithm for EL in PV Modules with Focal and Efficient IoU Loss
2024
Shen Ding | Wanting Jing | Hao Chen | Congyan Chen
Considering the defect detection issues in electroluminescence (EL) of photovoltaic (PV) cell systems, lots of factors result in performance degradation, including defect diversity, data imbalance, scale difference, etc. Focal-EIoU loss, an effective defect detection solution for EL, is proposed based on the improved YOLOv5. Firstly, by analyzing the detection background and scale characteristics of EL defects, a binary classification is carried out in the system. Subsequently, a cascade detection network based on YOLOv5 is designed to further extract features from the binary-classified defects. The defect localization and classification are achieved in this way. To address the problem of imbalanced defect samples, a loss function is designed based on EIoU and Focal-F1 Loss. Experimental results are illustrated to show the effectiveness. Compared with the existing CNN-based deep learning approaches, the proposed focal loss calculation-based method can effectively improve the performance of handling sample imbalance. Moreover, in the detection of 12 types of defects, the Yolov5 algorithms can always obtain higher MAP (mean average precision) even with different parameter levels (Yolov5m: 0.791 vs. 0.857, Yolov5l: 0.798 vs. 0.862, Yolov5x: 0.802 vs. 0.867, Yolov5s: 0.793 vs. 0.865).
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