Technological quality of near-isogenic lines of the wheat variety Thatcher carrying different leaf rust resistance genes
2001
Gal, M. | Szunics, L. | Szunics, L. | Vida, Gy. | Bedo, Z.
The adult leaf rust resistance of 33 near-isogenic lines of the wheat variety Thatcher, each carrying a different Lr gene, was studied in experiments artifically inoculated with leaf rust (1991-1999) and in an experiment protected with fungicide (1999). Tests were also made on a number of technological quality parameters, namely thousand kernel mass, kernel hardness, protein and wet gluten contents, gluten index and SDS sedimentation index.
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