Technological quality of near-isogenic lines of the wheat variety Thatcher carrying different leaf rust resistance genes
2001
Gal, M. | Szunics, L. | Szunics, L. | Vida, Gy. | Bedo, Z.
The adult leaf rust resistance of 33 near-isogenic lines of the wheat variety Thatcher, each carrying a different Lr gene, was studied in experiments artifically inoculated with leaf rust (1991-1999) and in an experiment protected with fungicide (1999). Tests were also made on a number of technological quality parameters, namely thousand kernel mass, kernel hardness, protein and wet gluten contents, gluten index and SDS sedimentation index.
显示更多 [+] 显示较少 [-]AGROVOC关键词
书目信息
页码
pp. 505-516
其它主题
Qualite; Teneur en proteines; Resistencia genetica; Resistance genetique; Ble tendre
语言
匈牙利
注释
Summaries Hu, En
翻译的标题
Thatcher alapu, levelrozsda rezisztenciagent hordozo kozel-izogen buzatorzsek technologiai minosege
类型
Summary; Bibliography
2003-08-15
AGRIS AP
在Google Scholar上查找
如果您发现与此记录相关的任何错误信息，请联系 [email protected]