FAO AGRIS - International System for Agricultural Science and Technology

Unravelling Yield and Yield-Related Traits in Soybean Using GGE Biplot and Path Analysis

Tonny Obua | Julius Pyton Sserumaga | Phinehas Tukamuhabwa | Mercy Namara | Bruno Awio | Johnson Mugarra | Geoffrey Tusiime | Godfree Chigeza


Bibliographic information
Volume 14 Issue 12 Pagination 2826 ISSN 2073-4395
Publisher
MDPI AG
Other Subjects
Gei; Biplot; Gge biplots
Language
English

2025-01-28
2026-02-03
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