Identification of novel associations of candidate genes with resistance to late blight in Solanum tuberosum Group Phureja
2017
A first association mapping experiment was conducted in Solanum tuberosum Group Phureja germplasm, which identified among 29 candidates two genes associated with quantitative resistance to late blight. Potato crop late blight is caused by the oomycete Phytophthora infestans. Quantitative disease resistance (QDR) can be genetically mapped to understand genetic architecture. Genomic, transcriptomic, and traditional quantitative trait loci (QTL) mapping information are useful to find and validate genes associated with late blight resistance. The results generated in this research enable the design of molecular markers that can be evaluated in potato breeding programs.
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Este registro bibliográfico ha sido proporcionado por International Development Research Centre
