Quantitative Modeling of Near-Field Interactions in Terahertz Near-Field Microscopy

Zhaomin Peng; Dehai Zhang; Shuqi Ge; Jin Meng

Quantitative Modeling of Near-Field Interactions in Terahertz Near-Field Microscopy

2023

Zhaomin Peng | Dehai Zhang | Shuqi Ge | Jin Meng

Terahertz scattering-scanning near-field optical microscopy (THz s-SNOM), combining the best features of terahertz technology and s-SNOM technology, has shown unique advantages in various applications. Consequently, building a model to characterize near-field interactions and investigate practical issues has become a popular topic in THz s-SNOM research. In this study, a finite element model (FEM) is proposed to quantify the near-field interactions, and to investigate the edge effect and antenna effect in THz s-SNOM. Our results indicate that the proposed model can give us a better understanding of the near-field interactions and direct the parameter design of the probe for THz s-SNOM.

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