AGRIS - 国际农业科技情报系统

Estimation of leaf area index, dry matter production, and grain yield by spectral reflectance in soybean

1996

Lee, Y.S. | Yun, S.H. | Park, M.E. (Rural Development Administration, Suwon (Korea Republic). National Institute of Agricultural Science and Technology) | Choi, D.H. (Rural Development Administration, Suwon (Korea Republic). Research Management Bureau)


书目信息
页码
pp. 316-320
其它主题
Metodos estadisticos; Methode statistique; Produccion; Medicion; Teneur en matiere seche
语言
韩国人
注释
Summaries (En, Ko)
3 illus.; 2 tables; 13 ref.
类型
Summary

1997-08-15
AGRIS AP
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