FAO AGRIS - International System for Agricultural Science and Technology

Relationship between incident radiation, leaf area and dry-matter yield in wheat

1986

Saini, A.D. | Nanda, R. (Indian Agricultural Research Inst., New Delhi)


Bibliographic information
Indian Journal of Agricultural Sciences (India)
Volume 56 Issue 9 ISSN 0019-5022
Pagination
pp. 638-645
Other Subjects
Ble; Variete; Radiaciones
Language
English
Note
18 ref. Summary (En)
Type
Summary

1987-08-15
AGRIS AP
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