FAO AGRIS - International System for Agricultural Science and Technology

Low-cost assessment of grain yield in durum wheat using RGB images

Fernandez-Gallego, Jose A. | Kefauver, Shawn C. | Vatter, Thomas | Aparicio Gutiérrez, Nieves | Nieto-Taladriz, María Teresa | Araus, José Luis


Bibliographic information
European journal of agronomy
Volume 105 Pagination 146 - 156 ISSN 1161-0301
Publisher
Elsevier B.V.
Other Subjects
Grain yield; Durum wheat; Grain yield; Triticum turgidum subsp. durum; Durum wheat; Irrigated conditions; Rgb indices; Abiotic stresses; Filling period; Low-cost phenotyping; Phenotype
Language
English
Type
Text; Journal Article

2024-02-28
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