FAO AGRIS - International System for Agricultural Science and Technology

Low-cost assessment of grain yield in durum wheat using RGB images

Fernandez-Gallego, Jose A. | Kefauver, Shawn C. | Vatter, Thomas | Aparicio Gutiérrez, Nieves | Nieto-Taladriz, María Teresa | Araus, José Luis


Bibliographic information
Volume 105 Pagination 146 - 156 ISSN 1161-0301
Publisher
Elsevier B.V.
Other Subjects
Grain yield; Grain yield; Abiotic stresses; Durum wheat; Phenotype; Irrigated conditions; Rgb indices; Low-cost phenotyping; Filling period; Triticum turgidum subsp. durum; Durum wheat
Language
English
Type
Journal Article; Text

2024-02-28
2026-02-03
MODS
Data Provider
Lookup at Google Scholar
If you notice any incorrect information relating to this record, please contact us at [email protected]