Towards direct imaging of defects in carbon nanotubes with 4DSTEM
2024
Louiset Antonin | Förster Daniel | Rouviere Jean-Luc | Jourdain Vincent | Bichara Christophe | Okuno Hanako
Bibliographic information
Publisher
EDP Sciences
Other Subjects
Carbon nanotubes; 4dstem; Electron ptychography
Language
English
2024-12-11
2026-01-23
DOAJ
Data Provider
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