FAO AGRIS - International System for Agricultural Science and Technology

Introgression of a 4D chromosomal fragment into durum wheat confers aluminium tolerance

2014

Han, Zhang | Ryan, Peter R. | Yan, ZeHong | Delhaize, Emmanuel


Bibliographic information
Volume 114 Issue 1 Pagination 135-144 - 144 ISSN 0305-7364
Publisher
Elsevier B.V.
Other Subjects
Plant characteristics; Aluminium tolerance; Rhizosheath; Homozygosity; Root growth; Taalmt1; Fine roots; Durum wheat; 4d chromosomal fragment; Grain yield; Acid soil; Substitution lines; Kna1
Language
English
License
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Type
Journal Article; Text

2024-02-29
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